Advances in x-Ray Analysis: Proccedings of the Forty-Second Annual Conference on Appl... (Bog, Hardback, Engelsk)
  1. Forside
  2. Bøger
  3. Engelske bøger
  4. Analytisk kemi
  5. Advances in x-Ray Analysis: Proccedings of the Forty-Second...

Advances in x-Ray Analysis: Proccedings of the Forty-Second Annual Conference on Applications of X-Ray Analysis Held in Denver, Colorado, August 2-6,

(Bog, Hardback, Engelsk)
Forfatter: Washington John V. Gilfrich (Sachs/Freeman Associates/NRL
Advances in x-Ray Analysis: Proccedings of the Forty-Second Annual Conference on Applications of X-Ray Analysis Held in Denver, Colorado, August 2-6,
Forlag: Kluwer Academic Publishers Group

Bemærk: Kan ikke leveres før jul.

Når du handler på WilliamDam.dk, betaler du den pris du ser.

  • Ingen gebyrer
  • Ingen abonnementer
  • Ingen bindingsperioder

Relaterede kategorier

Analytisk kemi
  = Emner / kategorier
  = Sektioner / guides
  = Specialsider
  = Kampagner

Læsernes anmeldelser (0)

Alle detaljer

Forlag Kluwer Academic Publishers Group
Forfatter Washington John V. Gilfrich (Sachs/Freeman Associates/NRL
Type Bog
Format Hardback
Sprog Engelsk
Udgivelsesdato 30-09-1994
Første udgivelsesår 1994
Fagredaktør C.C. Goldsmith, San Jose Ting C. Huang (IBM Almaden Research Center, Newton Square Ron Jenkins (International Centre for Diffraction Data, Yorktown Heights I. Cev Noyan (IBM Research Center
Originalsprog Netherlands
Sideantal 778
Indbinding Hardback
Forlag Kluwer Academic Publishers Group
Sideoplysninger 778 pages
ISBN-13 / EAN-13 9780306449017