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Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation

(Bog, Paperback / softback, Engelsk)
Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation
Forlag: Taylor & Francis Ltd

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Neutron and synchrotron X-ray diffraction have emerged as leading techniques for stress analysis. This book presents an overview of the principles of these techniques and examples of their applications to a range of materials and engineering problems. It contains 20 papers from leading international experts in residual stress analysis covering the

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Alle detaljer

Forlag Taylor & Francis Ltd
Type Bog
Format Paperback / softback
Sprog Engelsk
Udgivelsesdato 30-06-2020
Første udgivelsesår 2020
Fagredaktør M.E. Fitzpatrick, Alain Lodini
Originalsprog United Kingdom
Sideantal 368
Indbinding Paperback / softback
Forlag Taylor & Francis Ltd
Sideoplysninger 368 pages
Mål 229 x 152
ISBN-13 / EAN-13 9780367446802