Elements of Electromigration: Electromigration in 3D IC technology (Bog, Paperback / softback, Engelsk)
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Elements of Electromigration: Electromigration in 3D IC technology

(Bog, Paperback / softback, Engelsk)
Forfattere: King-Ning (City University of Hong Kong) Tu, Yingxia (City University of Hong Kong) Liu
Forlag: Taylor & Francis Ltd

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Forventes på lager: 26-12-2025

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In this invaluable resource for graduate students and practicing professionals, Tu and Liu provide a comprehensive account of electromigration and give a practical guide on how to manage its effects in microelectronic devices, especially newer devices that make use of 3D architectures.

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Alle detaljer

Forlag Taylor & Francis Ltd
Forfattere King-Ning (City University of Hong Kong) Tu, Yingxia (City University of Hong Kong) Liu
Type Bog
Format Paperback / softback
Sprog Engelsk
Udgivelsesdato 26-12-2025
Første udgivelsesår 2025
Illustrationer 5 Tables, black and white; 27 Line drawings, black and white; 38 Halftones, black and white; 65 Illustrations, black and white
Originalsprog United Kingdom
Sideantal 132
Indbinding Paperback / softback
Forlag Taylor & Francis Ltd
Sideoplysninger 132 pages, 5 Tables, black and white; 27 Line drawings, black and white; 38 Halftones, black and whi
Mål 246 x 174
ISBN-13 / EAN-13 9781032470283