Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
(Bog, Hardback, Engelsk)
Forlag:
Taylor & Francis Ltd
- Type: Bog
- Format: Hardback
-
Sprog:
Engelsk
- ISBN-13: 9781032375106
- Se flere detaljer ▼
Bemærk: Kan ikke leveres før jul.
Formater og udgaver
Beskrivelse
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.
Læsernes anmeldelser (0)
Alle detaljer
| Forlag | Taylor & Francis Ltd |
| Forfattere | Ch Sateesh (University of Johannesburg Kumar, M. Muralidhar (Madanapalle Institute of Technology & Science Singh, Ram (NIT Jamshedpur Krishna |
| Type | Bog |
| Format | Hardback |
| Sprog | Engelsk |
| Udgivelsesdato | 04-05-2023 |
| Første udgivelsesår | 2023 |
| Serie | Advanced Materials Processing and Manufacturing |
| Illustrationer | 52 Line drawings, black and white; 5 Halftones, black and white; 57 Illustrations, black and white |
| Originalsprog | United Kingdom |
| Sideantal | 130 |
| Indbinding | Hardback |
| Forlag | Taylor & Francis Ltd |
| Sideoplysninger | 130 pages, 52 Line drawings, black and white; 5 Halftones, black and white; 57 Illustrations, black |
| Mål | 161 x 241 x 14 |
| ISBN-13 / EAN-13 | 9781032375106 |