Atom-Probe Field Ion Microscopy: Field Ion Emission, and Surfaces and Interfaces at Atomic Resolution
(Bog, Paperback / softback, Engelsk)
Forlag:
Cambridge University Press
- Type: Bog
- Format: Paperback / softback
-
Sprog:
Engelsk
- ISBN-13: 9780521019934
- Se flere detaljer ▼
Bemærk: Kan ikke leveres før jul.
Beskrivelse
Atom-probe field ion microscopy is the only technique capable of imaging solid surfaces with atomic resolution, while chemically analysing surface atoms selected by the observer from the field ion image. This book presents the basic principles and illustrates the capabilities of the technique in the study of solid surfaces and interfaces at atomic resolution.
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Alle detaljer
| Forlag | Cambridge University Press |
| Forfatter | Tien T. (Pennsylvania State University) Tsong |
| Type | Bog |
| Format | Paperback / softback |
| Sprog | Engelsk |
| Udgivelsesdato | 15-09-2005 |
| Første udgivelsesår | 2005 |
| Illustrationer | Worked examples or Exercises |
| Originalsprog | United Kingdom |
| Sideantal | 400 |
| Indbinding | Paperback / softback |
| Forlag | Cambridge University Press |
| Sideoplysninger | 400 pages, Worked examples or Exercises |
| Mål | 234 x 157 x 22 |
| ISBN-13 / EAN-13 | 9780521019934 |