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Forventes på lager: 02-08-2014
Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography. Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy.
| Forlag | Springer-Verlag New York Inc. |
| Forfattere | Michael K. Miller, Richard G. Forbes |
| Type | Bog |
| Format | Hardback |
| Sprog | Engelsk |
| Udgave | 2014 ed. |
| Udgivelsesdato | 02-08-2014 |
| Første udgivelsesår | 2014 |
| Illustrationer | 62 Illustrations, color; 120 Illustrations, black and white; XVIII, 423 p. 182 illus., 62 illus. in color. |
| Originalsprog | United States |
| Sideantal | 423 |
| Indbinding | Hardback |
| Forlag | Springer-Verlag New York Inc. |
| Sideoplysninger | 423 pages, 62 Illustrations, color; 120 Illustrations, black and white; XVIII, 423 p. 182 illus., 62 |
| Mål | 242 x 163 x 23 |
| ISBN-13 / EAN-13 | 9781489974297 |