Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide
(Bog, Hardback, Engelsk)
Beskrivelse
Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor.
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| Forlag | Springer-Verlag Berlin and Heidelberg GmbH & Co. KG |
| Forfatter | Siegfried Hofmann |
| Type | Bog |
| Format | Hardback |
| Sprog | Engelsk |
| Udgave | 2013 ed. |
| Udgivelsesdato | 25-10-2012 |
| Første udgivelsesår | 2012 |
| Serie | Springer Series in Surface Sciences |
| Illustrationer | XX, 528 p. |
| Originalsprog | Germany |
| Sideantal | 528 |
| Indbinding | Hardback |
| Forlag | Springer-Verlag Berlin and Heidelberg GmbH & Co. KG |
| Sideoplysninger | 528 pages, XX, 528 p. |
| Mål | 241 x 161 x 34 |
| ISBN-13 / EAN-13 | 9783642273803 |