1. Forside
  2. Bøger
  3. Engelske bøger
  4. Kondenserede fasers fysik (væskeform og...
  5. Materialelære
  6. Characterization of High Tc Materials and Devices by Electron...

Characterization of High Tc Materials and Devices by Electron Microscopy

(Bog, Paperback / softback, Engelsk)
Characterization of High Tc Materials and Devices by Electron Microscopy
Forlag: Cambridge University Press

Når du handler på WilliamDam.dk, betaler du den pris du ser.

  • Ingen gebyrer
  • Ingen abonnementer
  • Ingen bindingsperioder

Relaterede kategorier

Kondenserede fasers fysik (væskeform og faststoffysik) Materialelære
  = Emner / kategorier
  = Sektioner / guides
  = Specialsider
  = Kampagner

Beskrivelse

This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.

Læsernes anmeldelser (0)

Alle detaljer

Forlag Cambridge University Press
Type Bog
Format Paperback / softback
Sprog Engelsk
Udgivelsesdato 23-11-2006
Første udgivelsesår 2006
Illustrationer 3 Tables, unspecified; 152 Halftones, unspecified; 115 Line drawings, unspecified
Fagredaktør Nigel D. (University of Illinois Browning, Stephen J. (Oak Ridge National Laboratory Pennycook
Originalsprog United Kingdom
Sideantal 408
Indbinding Paperback / softback
Forlag Cambridge University Press
Sideoplysninger 408 pages, 3 Tables, unspecified; 152 Halftones, unspecified; 115 Line drawings, unspecified
Mål 243 x 168 x 21
ISBN-13 / EAN-13 9780521031707