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Forventes på lager: 28-06-2013
This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors.
| Forlag | John Wiley & Sons Inc |
| Forfatter | Christine M. Mahoney |
| Type | Bog |
| Format | Hardback |
| Sprog | Engelsk |
| Udgivelsesdato | 28-06-2013 |
| Første udgivelsesår | 2013 |
| Serie | Wiley Series on Mass Spectrometry |
| Originalsprog | United States |
| Sideantal | 380 |
| Indbinding | Hardback |
| Forlag | John Wiley & Sons Inc |
| Sideoplysninger | 380 pages |
| Mål | 165 x 243 x 21 |
| ISBN-13 / EAN-13 | 9780470886052 |