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Forventes på lager: 21-04-2016
The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits.
| Forlag | Springer Verlag, Singapore |
| Forfatter | Jiann-Shiun Yuan |
| Type | Bog |
| Format | Paperback / softback |
| Sprog | Engelsk |
| Udgave | 1st ed. 2016 |
| Udgivelsesdato | 21-04-2016 |
| Første udgivelsesår | 2016 |
| Serie | SpringerBriefs in Applied Sciences and Technology |
| Illustrationer | 101 Illustrations, black and white; VI, 106 p. 101 illus. |
| Originalsprog | Singapore |
| Sideantal | 106 |
| Indbinding | Paperback / softback |
| Forlag | Springer Verlag, Singapore |
| Sideoplysninger | 106 pages, 101 Illustrations, black and white; VI, 106 p. 101 illus. |
| Mål | 235 x 155 |
| ISBN-13 / EAN-13 | 9789811008825 |