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Design and Analysis of Accelerated Tests for Mission Critical Reliability

(Bog, Hardback, Engelsk)
Forfattere: Michael J. LuValle, Bruce G. LeFevre, SirRaman Kannan
Forlag: Taylor & Francis Inc

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Presents theory and methods for recognizing and handling the more complicated cases often encountered in practice. This work integrates a physical understanding of underlying phenomena and the statistical modeling of observation 'noise' to provide a single theoretical framework for accelerated testing.

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Alle detaljer

Forlag Taylor & Francis Inc
Forfattere Michael J. LuValle, Bruce G. LeFevre, SirRaman Kannan
Type Bog
Format Hardback
Sprog Engelsk
Udgivelsesdato 27-04-2004
Første udgivelsesår 2004
Illustrationer 7 Tables, black and white; 130 Illustrations, black and white
Originalsprog United States
Sideantal 248
Indbinding Hardback
Forlag Taylor & Francis Inc
Sideoplysninger 248 pages, 7 Tables, black and white; 130 Illustrations, black and white
Mål 234 x 156
ISBN-13 / EAN-13 9781584884712