Digital Noise Monitoring of Defect Origin
(Bog, Hardback, Engelsk)
Forlag:
Springer-Verlag New York Inc.
- Type: Bog
- Format: Hardback
-
Sprog:
Engelsk
- ISBN-13: 9780387717531
- Se flere detaljer ▼
Beskrivelse
Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others.
Læsernes anmeldelser (0)
Alle detaljer
| Forlag | Springer-Verlag New York Inc. |
| Forfatter | Telman Aliev |
| Type | Bog |
| Format | Hardback |
| Sprog | Engelsk |
| Udgave | 2007 ed. |
| Udgivelsesdato | 25-07-2007 |
| Første udgivelsesår | 2007 |
| Serie | Lecture Notes in Electrical Engineering |
| Illustrationer | XII, 224 p. |
| Originalsprog | United States |
| Sideantal | 224 |
| Indbinding | Hardback |
| Forlag | Springer-Verlag New York Inc. |
| Sideoplysninger | 224 pages, XII, 224 p. |
| Mål | 235 x 155 |
| ISBN-13 / EAN-13 | 9780387717531 |