Bemærk: Kan ikke leveres før jul.
Forventes på lager: 27-08-2015
Properties of wave localization play a decisive role both in applications of engineered microstructures and in the detection of cracks and flaws.
| Forlag | Springer Verlag GmbH |
| Type | Bog |
| Format | Paperback / softback |
| Sprog | Engelsk |
| Udgave | Softcover reprint of the original 1st ed. 2013 |
| Udgivelsesdato | 27-08-2015 |
| Første udgivelsesår | 2015 |
| Serie | CISM International Centre for Mechanical Sciences |
| Illustrationer | VII, 256 p. |
| Fagredaktør | Richard V. Craster, Julius Kaplunov |
| Originalsprog | Austria |
| Sideantal | 256 |
| Indbinding | Paperback / softback |
| Forlag | Springer Verlag GmbH |
| Sideoplysninger | 256 pages, VII, 256 p. |
| Mål | 235 x 155 |
| ISBN-13 / EAN-13 | 9783709117583 |