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Forventes på lager: 26-02-2025
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.
| Forlag | Springer International Publishing AG |
| Forfattere | Jens Lienig, Susann Rothe, Matthias Thiele |
| Type | Bog |
| Format | Hardback |
| Sprog | Engelsk |
| Udgave | Second Edition 2025 |
| Udgivelsesdato | 26-02-2025 |
| Første udgivelsesår | 2025 |
| Illustrationer | 95 Illustrations, color; 5 Illustrations, black and white; XV, 167 p. 100 illus., 95 illus. in color. |
| Originalsprog | Switzerland |
| Sideantal | 167 |
| Indbinding | Hardback |
| Forlag | Springer International Publishing AG |
| Sideoplysninger | 167 pages, 95 Illustrations, color; 5 Illustrations, black and white; XV, 167 p. 100 illus., 95 illu |
| Mål | 235 x 155 |
| ISBN-13 / EAN-13 | 9783031800221 |