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Forventes på lager: 27-11-2001
"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."
| Forlag | Taylor & Francis Inc |
| Type | Bog |
| Format | Hardback |
| Sprog | Engelsk |
| Udgave | 2 ed |
| Udgivelsesdato | 27-11-2001 |
| Første udgivelsesår | 2001 |
| Serie | Practical Spectroscopy |
| Fagredaktør | Rene Van Grieken, A. Markowicz |
| Originalsprog | United States |
| Sideantal | 1004 |
| Indbinding | Hardback |
| Forlag | Taylor & Francis Inc |
| Sideoplysninger | 1004 pages |
| Mål | 262 x 184 x 58 |
| ISBN-13 / EAN-13 | 9780824706005 |