Integrated Circuit Failure Analysis: A Guide to Preparation Techniques
(Bog, Hardback, Engelsk)
Forlag:
John Wiley & Sons Inc
- Type: Bog
- Format: Hardback
-
Sprog:
Engelsk
- ISBN-13: 9780471974017
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Beskrivelse
The construction and failure analysis of highly integrated semiconductor components has gained in significance with the explosive growth in the semiconductor industry. Once a subordinate laboratory task, semiconductor failure analysis has now become a discipline in its own right.
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| Forlag | John Wiley & Sons Inc |
| Forfatter | Friedrich (Siemens AG Beck |
| Type | Bog |
| Format | Hardback |
| Sprog | Engelsk |
| Udgivelsesdato | 19-01-1998 |
| Første udgivelsesår | 1998 |
| Serie | Quality and Reliability Engineering Series |
| Originalsprog | United States |
| Sideantal | 192 |
| Indbinding | Hardback |
| Forlag | John Wiley & Sons Inc |
| Sideoplysninger | 192 pages |
| Mål | 159 x 237 x 16 |
| ISBN-13 / EAN-13 | 9780471974017 |