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Forventes på lager: 29-10-2010
Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
| Forlag | Springer-Verlag New York Inc. |
| Type | Bog |
| Format | Paperback / softback |
| Sprog | Engelsk |
| Udgave | Softcover reprint of hardcover 1st ed. 2005 |
| Udgivelsesdato | 29-10-2010 |
| Første udgivelsesår | 2010 |
| Illustrationer | 28 Illustrations, color; 6 Illustrations, black and white |
| Fagredaktør | Lucille A. Giannuzzi |
| Originalsprog | United States |
| Sideantal | 357 |
| Indbinding | Paperback / softback |
| Forlag | Springer-Verlag New York Inc. |
| Sideoplysninger | 357 pages, 28 Illustrations, color; 6 Illustrations, black and white |
| Mål | 154 x 233 x 29 |
| ISBN-13 / EAN-13 | 9781441935748 |