Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications
(Bog, Hardback, Engelsk)
- Type: Bog
- Format: Hardback
-
Sprog:
Engelsk
- ISBN-13: 9783540253037
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Beskrivelse
Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques.
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| Forlag | Springer-Verlag Berlin and Heidelberg GmbH & Co. KG |
| Forfatter | Stefan Rein |
| Type | Bog |
| Format | Hardback |
| Sprog | Engelsk |
| Udgave | 2005 ed. |
| Udgivelsesdato | 23-06-2005 |
| Første udgivelsesår | 2005 |
| Serie | Springer Series in Materials Science |
| Illustrationer | XXVI, 492 p. |
| Originalsprog | Germany |
| Sideantal | 492 |
| Indbinding | Hardback |
| Forlag | Springer-Verlag Berlin and Heidelberg GmbH & Co. KG |
| Sideoplysninger | 492 pages, XXVI, 492 p. |
| Mål | 166 x 241 x 37 |
| ISBN-13 / EAN-13 | 9783540253037 |