Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Bog, Hardback, Engelsk)
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Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials

(Bog, Hardback, Engelsk)
Forfattere: Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert
Forlag: Springer International Publishing AG

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Beskrivelse

Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems.

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Alle detaljer

Forlag Springer International Publishing AG
Forfattere Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert
Type Bog
Format Hardback
Sprog Engelsk
Udgave Third Edition 2018
Udgivelsesdato 22-01-2019
Første udgivelsesår 2019
Serie Springer Series in Advanced Microelectronics
Illustrationer 68 Illustrations, color; 58 Illustrations, black and white; XXI, 321 p. 126 illus., 68 illus. in color.
Originalsprog Switzerland
Sideantal 321
Indbinding Hardback
Forlag Springer International Publishing AG
Sideoplysninger 321 pages, 68 Illustrations, color; 58 Illustrations, black and white; XXI, 321 p. 126 illus., 68 il
Mål 235 x 155
ISBN-13 / EAN-13 9783319998244