Forventes på lager: 14-03-2023
This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems.
| Forlag | Springer International Publishing AG |
| Type | Bog |
| Format | Hardback |
| Sprog | Engelsk |
| Udgave | 2023 ed. |
| Udgivelsesdato | 14-03-2023 |
| Første udgivelsesår | 2023 |
| Illustrationer | 165 Illustrations, black and white |
| Fagredaktør | Patrick Girard, Shawn Blanton, Li-C. Wang |
| Originalsprog | Switzerland |
| Sideantal | 316 |
| Indbinding | Hardback |
| Forlag | Springer International Publishing AG |
| Sideoplysninger | 316 pages, 165 Illustrations, black and white |
| Mål | 241 x 166 x 24 |
| ISBN-13 / EAN-13 | 9783031196386 |