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  5. Measurement Techniques for Radio Frequency Nanoelectronics

Measurement Techniques for Radio Frequency Nanoelectronics

(Bog, Hardback, Engelsk)
Forfattere: T. Mitch Wallis, Pavel Kabos
Measurement Techniques for Radio Frequency Nanoelectronics
Forlag: Cambridge University Press

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Beskrivelse

Understand the fundamentals of radio frequency measurement of nanoscale devices with this practical, cross-disciplinary guide. Featuring numerous examples linking theoretical concepts with real-world applications, it is the ideal resource for researchers in both academia and industry new to the field of radio frequency nanoelectronics.

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Alle detaljer

Forlag Cambridge University Press
Forfattere T. Mitch Wallis, Pavel Kabos
Type Bog
Format Hardback
Sprog Engelsk
Udgivelsesdato 14-09-2017
Første udgivelsesår 2017
Serie The Cambridge RF and Microwave Engineering Series
Illustrationer 4 Tables, black and white; 50 Halftones, black and white; 52 Line drawings, black and white
Originalsprog United Kingdom
Sideantal 328
Indbinding Hardback
Forlag Cambridge University Press
Sideoplysninger 328 pages, 4 Tables, black and white; 50 Halftones, black and white; 52 Line drawings, black and whi
Mål 253 x 178 x 18
ISBN-13 / EAN-13 9781107120686