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Forventes på lager: 29-06-2023
This book covers fundamental microscopic techniques for Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Atomic Force Microscopy (AFM), and other microscopic tools.
| Forlag | Springer Nature Switzerland AG |
| Type | Bog |
| Format | Paperback / softback |
| Sprog | Engelsk |
| Udgave | 2022 ed. |
| Udgivelsesdato | 29-06-2023 |
| Første udgivelsesår | 2023 |
| Illustrationer | 100 Illustrations, color; 27 Illustrations, black and white |
| Fagredaktør | Sathish-Kumar Kamaraj, Arun Thirumurugan, Shanmuga Sundar Dhanabalan, Samuel A. Hevia |
| Originalsprog | Switzerland |
| Sideantal | 247 |
| Indbinding | Paperback / softback |
| Forlag | Springer Nature Switzerland AG |
| Sideoplysninger | 247 pages, 100 Illustrations, color; 27 Illustrations, black and white |
| Mål | 235 x 155 |
| ISBN-13 / EAN-13 | 9783030995447 |