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Forventes på lager: 20-04-2000
-XRF analysis is a recently developed, highly sensitive analytical technique. This topical publication provides a detailed overview of the applications of -XRF in industrial and academic circles.
| Forlag | John Wiley & Sons Inc |
| Type | Bog |
| Format | Hardback |
| Sprog | Engelsk |
| Udgivelsesdato | 20-04-2000 |
| Første udgivelsesår | 2000 |
| Fagredaktør | Koen H. A. (University of Antwerp Janssens, Freddy C. V. (University of Antwerp Adams, Anders (Chalmers University of Technology Rindby |
| Originalsprog | United States |
| Sideantal | 434 |
| Indbinding | Hardback |
| Forlag | John Wiley & Sons Inc |
| Sideoplysninger | 434 pages |
| Mål | 234 x 160 x 31 |
| ISBN-13 / EAN-13 | 9780471974260 |