Microscopy of Semiconducting Materials: 1999 Proceedings of the Institute of Physics Conference held 22-25 March 1999, University of Oxford, UK
(Bog, Hardback, Engelsk)
Forlag:
Taylor & Francis Ltd
- Type: Bog
- Format: Hardback
-
Sprog:
Engelsk
- ISBN-13: 9780750306508
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Beskrivelse
Presents an overview of advances in semiconductor studies using microscopy. This book explores the use of transmission and scanning electron microscopy, ultra fine electron probes, and EELS to investigate semi conducting structures. It is suitable for academics and researchers in materials science, and electrical and electronic engineering.
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| Forlag | Taylor & Francis Ltd |
| Type | Bog |
| Format | Hardback |
| Sprog | Engelsk |
| Udgivelsesdato | 01-01-2000 |
| Første udgivelsesår | 2000 |
| Serie | Institute of Physics Conference Series |
| Fagredaktør | A.G (University of Sheffield Cullis, R (GEC-Marconi Beanland |
| Originalsprog | United Kingdom |
| Sideantal | 772 |
| Indbinding | Hardback |
| Forlag | Taylor & Francis Ltd |
| Sideoplysninger | 772 pages |
| Mål | 234 x 156 |
| ISBN-13 / EAN-13 | 9780750306508 |