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Forventes på lager: 27-04-2020
III-V materials, 2D materials, and multi-state defects. Describes the state-of-the-art, regarding noise in nanometer semiconductor devices;Enables readers to design more reliable semiconductor devices;Offers the most up-to-date information on point defects, based on physical microscopic models.
| Forlag | Springer Nature Switzerland AG |
| Type | Bog |
| Format | Hardback |
| Sprog | Engelsk |
| Udgave | 2020 ed. |
| Udgivelsesdato | 27-04-2020 |
| Første udgivelsesår | 2020 |
| Illustrationer | 443 Illustrations, color; 107 Illustrations, black and white; VI, 729 p. 550 illus., 443 illus. in color. |
| Fagredaktør | Tibor Grasser |
| Originalsprog | Switzerland |
| Sideantal | 729 |
| Indbinding | Hardback |
| Forlag | Springer Nature Switzerland AG |
| Sideoplysninger | 729 pages, 443 Illustrations, color; 107 Illustrations, black and white; VI, 729 p. 550 illus., 443 |
| Mål | 235 x 155 |
| ISBN-13 / EAN-13 | 9783030374990 |