Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM (Bog, Paperback / softback, Engelsk)
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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

(Bog, Paperback / softback, Engelsk)
Forfatter: R.F. Egerton
Forlag: Springer International Publishing AG

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Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences.

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Alle detaljer

Forlag Springer International Publishing AG
Forfatter R.F. Egerton
Type Bog
Format Paperback / softback
Sprog Engelsk
Udgave Softcover reprint of the original 2nd ed. 2016
Udgivelsesdato 30-05-2018
Første udgivelsesår 2018
Illustrationer 15 Illustrations, color; 109 Illustrations, black and white; XI, 196 p. 124 illus., 15 illus. in color.
Originalsprog Switzerland
Sideantal 196
Indbinding Paperback / softback
Forlag Springer International Publishing AG
Sideoplysninger 196 pages, 15 Illustrations, color; 109 Illustrations, black and white; XI, 196 p. 124 illus., 15 il
Mål 156 x 234 x 16
ISBN-13 / EAN-13 9783319819860