Positron Annihilation in Semiconductors: Defect Studies
(Bog, Paperback / softback, Engelsk)
- Type: Bog
- Format: Paperback / softback
-
Sprog:
Engelsk
- ISBN-13: 9783642084034
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Beskrivelse
The subject of this book is the investigation of lattice imperfections in semiconductors by means of positron annihilation. The sensitivity range of positron annihilation with respect to the detection of these defects is compared to that of other defect-sensitive methods.
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| Forlag | Springer-Verlag Berlin and Heidelberg GmbH & Co. KG |
| Forfattere | Reinhard Krause-Rehberg, Hartmut S. Leipner |
| Type | Bog |
| Format | Paperback / softback |
| Sprog | Engelsk |
| Udgave | Softcover reprint of hardcover 1st ed. 1999 |
| Udgivelsesdato | 01-12-2010 |
| Første udgivelsesår | 2010 |
| Serie | Springer Series in Solid-State Sciences |
| Illustrationer | 121 Illustrations, black and white |
| Originalsprog | Germany |
| Sideantal | 383 |
| Indbinding | Paperback / softback |
| Forlag | Springer-Verlag Berlin and Heidelberg GmbH & Co. KG |
| Sideoplysninger | 383 pages, 121 Illustrations, black and white |
| Mål | 156 x 232 x 47 |
| ISBN-13 / EAN-13 | 9783642084034 |