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Forventes på lager: 29-10-2002
Ion scattering spectrometry, a powerful analytical tool used to determine the structure and composition of a substance, addresses critical problems in semiconductors, thin film growth, coatings, computer chips, magnetic storage devices, bioreactive surfaces, catalytic surfaces, and electrochemical surfaces (including the large battery industry).
| Forlag | John Wiley & Sons Inc |
| Forfatter | J. Wayne (University of Houston) Rabalais |
| Type | Bog |
| Format | Hardback |
| Sprog | Engelsk |
| Udgivelsesdato | 29-10-2002 |
| Første udgivelsesår | 2002 |
| Serie | Wiley Series on Mass Spectrometry |
| Illustrationer | Drawings: 155 B&W, 0 Color |
| Originalsprog | United States |
| Sideantal | 344 |
| Indbinding | Hardback |
| Forlag | John Wiley & Sons Inc |
| Sideoplysninger | 344 pages, Drawings: 155 B&W, 0 Color |
| Mål | 243 x 159 x 20 |
| ISBN-13 / EAN-13 | 9780471202776 |