Progress in Nanoscale Characterization and Manipulation
(Bog, Paperback / softback, Engelsk)
Forlag:
Springer Verlag, Singapore
- Type: Bog
- Format: Paperback / softback
-
Sprog:
Engelsk
- ISBN-13: 9789811344206
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Beskrivelse
It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy.
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| Forlag | Springer Verlag, Singapore |
| Type | Bog |
| Format | Paperback / softback |
| Sprog | Engelsk |
| Udgave | Softcover Reprint of the Original 1st 2018 ed. |
| Udgivelsesdato | 11-01-2019 |
| Første udgivelsesår | 2019 |
| Serie | Springer Tracts in Modern Physics |
| Illustrationer | 26 Illustrations, color; 307 Illustrations, black and white; VII, 508 p. 333 illus., 26 illus. in color. |
| Fagredaktør | Rongming Wang, Chen Wang, Hongzhou Zhang, Jing Tao, Xuedong Bai |
| Originalsprog | Singapore |
| Sideantal | 508 |
| Indbinding | Paperback / softback |
| Forlag | Springer Verlag, Singapore |
| Sideoplysninger | 508 pages, 26 Illustrations, color; 307 Illustrations, black and white; VII, 508 p. 333 illus., 26 i |
| Mål | 235 x 155 |
| ISBN-13 / EAN-13 | 9789811344206 |