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Forventes på lager: 01-12-2025
This book is a comprehensive overview of the discoveries in composition, growth and control of gold-aluminum intermetallic compounds in microelectronic interconnects. It focuses on the history of detection, theory and understanding of the gold/aluminum interface reliability issues.
| Forlag | Taylor & Francis Ltd |
| Forfattere | Syed Sajid Ahmad, Richard C. Blish II |
| Type | Bog |
| Format | Hardback |
| Sprog | Engelsk |
| Udgivelsesdato | 01-12-2025 |
| Første udgivelsesår | 2025 |
| Illustrationer | 5 Tables, black and white; 6 Line drawings, color; 12 Line drawings, black and white; 2 Halftones, color; 11 Halftones, black and white; 8 Illustrations, color; 23 Illustrations, black and white |
| Originalsprog | United Kingdom |
| Sideantal | 132 |
| Indbinding | Hardback |
| Forlag | Taylor & Francis Ltd |
| Sideoplysninger | 132 pages, 5 Tables, black and white; 6 Line drawings, color; 12 Line drawings, black and white; 2 H |
| Mål | 234 x 156 |
| ISBN-13 / EAN-13 | 9781041024248 |