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Reliability Wearout Mechanisms in Advanced CMOS Technologies

(Bog, Hardback, Engelsk)
Forfattere: Alvin W. (IBM) Strong, Ernest Y. (IBM) Wu, Rolf-Peter (Infineon) Vollertsen, Jordi (Universitat Autonoma de Barcelona Sune, Giuseppe (IBM) La Rosa, Timothy D. (IBM) Sullivan, Stewart E. Rauch
Reliability Wearout Mechanisms in Advanced CMOS Technologies
Forlag: John Wiley & Sons Inc

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This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.

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Alle detaljer

Forlag John Wiley & Sons Inc
Forfattere Alvin W. (IBM) Strong, Ernest Y. (IBM) Wu, Rolf-Peter (Infineon) Vollertsen, Jordi (Universitat Autonoma de Barcelona Sune, Giuseppe (IBM) La Rosa, Timothy D. (IBM) Sullivan, Stewart E. Rauch
Type Bog
Format Hardback
Sprog Engelsk
Udgivelsesdato 04-09-2009
Første udgivelsesår 2009
Serie IEEE Press Series on Microelectronic Systems
Illustrationer Photos: 25 B&W, 0 Color; Drawings: 475 B&W, 0 Color; Tables: 70 B&W, 0 Color
Originalsprog United States
Sideantal 640
Indbinding Hardback
Forlag John Wiley & Sons Inc
Sideoplysninger 640 pages, Photos: 25 B&W, 0 Color; Drawings: 475 B&W, 0 Color; Tables: 70 B&W, 0 Color
Mål 243 x 164 x 34
ISBN-13 / EAN-13 9780471731726