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Forventes på lager: 03-01-2001
Scanning tunneling microscopy (STM) provides 3-dimensional, real-space images of surfaces at high resolution. In the 15 years since its invention, the technique has become widely used as a characterization tool in materials science, semiconductor physics, biology, electrochemistry, and surface science.
| Forlag | John Wiley & Sons Inc |
| Forfatter | D Bonnell |
| Type | Bog |
| Format | Hardback |
| Sprog | Engelsk |
| Udgave | 2 ed |
| Udgivelsesdato | 03-01-2001 |
| Første udgivelsesår | 2001 |
| Fagredaktør | Dawn Bonnell |
| Originalsprog | United States |
| Sideantal | 516 |
| Indbinding | Hardback |
| Forlag | John Wiley & Sons Inc |
| Sideoplysninger | 516 pages |
| Mål | 163 x 244 x 34 |
| ISBN-13 / EAN-13 | 9780471248248 |