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Forventes på lager: 30-09-2010
Provides a comprehensive presentation of the research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, and more.
| Forlag | Springer-Verlag New York Inc. |
| Type | Bog |
| Format | Hardback |
| Sprog | Engelsk |
| Udgave | 2011 ed. |
| Udgivelsesdato | 30-09-2010 |
| Første udgivelsesår | 2010 |
| Serie | Frontiers in Electronic Testing |
| Illustrationer | XVIII, 318 p. |
| Fagredaktør | Michael Nicolaidis |
| Originalsprog | United States |
| Sideantal | 318 |
| Indbinding | Hardback |
| Forlag | Springer-Verlag New York Inc. |
| Sideoplysninger | 318 pages, XVIII, 318 p. |
| Mål | 235 x 155 |
| ISBN-13 / EAN-13 | 9781441969927 |