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Forventes på lager: 14-06-2018
This book deals with standard spectroscopic techniques which can be used to analyze semiconductor samples or devices, in both, bulk, micrometer and submicrometer scale. The book aims helping experimental physicists and engineers to choose the right analytical spectroscopic technique in order to get specific information about their specific demands.
| Forlag | Springer International Publishing AG |
| Forfattere | Juan Jimenez, Jens W. Tomm |
| Type | Bog |
| Format | Paperback / softback |
| Sprog | Engelsk |
| Udgave | Softcover reprint of the original 1st ed. 2016 |
| Udgivelsesdato | 14-06-2018 |
| Første udgivelsesår | 2018 |
| Serie | Springer Series in Optical Sciences |
| Illustrationer | 43 Illustrations, color; 113 Illustrations, black and white; XI, 307 p. 156 illus., 43 illus. in color. |
| Originalsprog | Switzerland |
| Sideantal | 307 |
| Indbinding | Paperback / softback |
| Forlag | Springer International Publishing AG |
| Sideoplysninger | 307 pages, 43 Illustrations, color; 113 Illustrations, black and white; XI, 307 p. 156 illus., 43 il |
| Mål | 234 x 154 x 20 |
| ISBN-13 / EAN-13 | 9783319825564 |