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Forventes på lager: 23-01-2019
Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizations in solar cell research fields.
| Forlag | Springer International Publishing AG |
| Type | Bog |
| Format | Hardback |
| Sprog | Engelsk |
| Udgave | 2018 ed. |
| Udgivelsesdato | 23-01-2019 |
| Første udgivelsesår | 2019 |
| Serie | Springer Series in Optical Sciences |
| Illustrationer | 204 Illustrations, color; 126 Illustrations, black and white; XXI, 616 p. 330 illus., 204 illus. in color. |
| Fagredaktør | Hiroyuki Fujiwara, Robert W. Collins |
| Originalsprog | Switzerland |
| Sideantal | 616 |
| Indbinding | Hardback |
| Forlag | Springer International Publishing AG |
| Sideoplysninger | 616 pages, 204 Illustrations, color; 126 Illustrations, black and white; XXI, 616 p. 330 illus., 204 |
| Mål | 235 x 155 |
| ISBN-13 / EAN-13 | 9783319951379 |