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Forventes på lager: 07-12-2010
Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods.
| Forlag | Springer-Verlag New York Inc. |
| Type | Bog |
| Format | Paperback / softback |
| Sprog | Engelsk |
| Udgave | 1st ed. Softcover of orig. ed. 2004 |
| Udgivelsesdato | 07-12-2010 |
| Første udgivelsesår | 2010 |
| Illustrationer | XIV, 298 p. |
| Fagredaktør | Jose Luis Huertas Diaz |
| Originalsprog | United States |
| Sideantal | 298 |
| Indbinding | Paperback / softback |
| Forlag | Springer-Verlag New York Inc. |
| Sideoplysninger | 298 pages, XIV, 298 p. |
| Mål | 244 x 170 |
| ISBN-13 / EAN-13 | 9781441954220 |