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Thin Film Analysis by X-Ray Scattering

(Bog, Hardback, Engelsk)
Forfatter: Mario (IHP Microelectronics Birkholz
Thin Film Analysis by X-Ray Scattering
Forlag: Wiley-VCH Verlag GmbH

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Beskrivelse

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films.

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Alle detaljer

Forlag Wiley-VCH Verlag GmbH
Forfatter Mario (IHP Microelectronics Birkholz
Type Bog
Format Hardback
Sprog Engelsk
Udgivelsesdato 15-11-2005
Første udgivelsesår 2005
Originalsprog Germany
Sideantal 378
Indbinding Hardback
Forlag Wiley-VCH Verlag GmbH
Sideoplysninger 378 pages
Mål 248 x 170 x 26
ISBN-13 / EAN-13 9783527310524