Bemærk: Kan leveres før jul.
Forventes på lager: 01-01-1999
Offers an overview of applications for selected electron microscope techniques that have become widespread in their use for furthering our understanding of how materials behave. This work discusses topics including weak-beam techniques for problem solving, defect structures and dislocation interactions, and atomic level imaging applications.
| Forlag | Taylor & Francis Ltd |
| Type | Bog |
| Format | Hardback |
| Sprog | Engelsk |
| Udgivelsesdato | 01-01-1999 |
| Første udgivelsesår | 1999 |
| Serie | Series in Microscopy in Materials Science |
| Fagredaktør | Peter. B (University Of Oxford Hirsch |
| Originalsprog | United Kingdom |
| Sideantal | 208 |
| Indbinding | Hardback |
| Forlag | Taylor & Francis Ltd |
| Sideoplysninger | 208 pages |
| Mål | 162 x 241 x 18 |
| ISBN-13 / EAN-13 | 9780750305389 |