Transmission Electron Microscopy and Diffractometry of Materials
(Bog, Hardback, Engelsk)
Beskrivelse
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials.
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| Forlag | Springer-Verlag Berlin and Heidelberg GmbH & Co. KG |
| Forfattere | Brent Fultz, James Howe |
| Type | Bog |
| Format | Hardback |
| Sprog | Engelsk |
| Udgave | Fourth Edition 2013 |
| Udgivelsesdato | 14-10-2012 |
| Første udgivelsesår | 2012 |
| Serie | Graduate Texts in Physics |
| Illustrationer | XX, 764 p. |
| Originalsprog | Germany |
| Sideantal | 764 |
| Indbinding | Hardback |
| Forlag | Springer-Verlag Berlin and Heidelberg GmbH & Co. KG |
| Sideoplysninger | 764 pages, XX, 764 p. |
| Mål | 235 x 155 |
| ISBN-13 / EAN-13 | 9783642297601 |