VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India, July 4–... (Bog, Paperback / softback, Engelsk)
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VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers

(Bog, Paperback / softback, Engelsk)
VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
Forlag: Springer Verlag, Singapore

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Beskrivelse

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design;

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Alle detaljer

Forlag Springer Verlag, Singapore
Type Bog
Format Paperback / softback
Sprog Engelsk
Udgave 2019 ed.
Udgivelsesdato 18-08-2019
Første udgivelsesår 2019
Serie Communications in Computer and Information Science
Illustrationer 336 Illustrations, color; 209 Illustrations, black and white
Fagredaktør Anirban Sengupta, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, Santosh Kumar Vishvakarma
Originalsprog Singapore
Sideantal 775
Indbinding Paperback / softback
Forlag Springer Verlag, Singapore
Sideoplysninger 775 pages, 336 Illustrations, color; 209 Illustrations, black and white
Mål 235 x 155
ISBN-13 / EAN-13 9789813297661