Bemærk: Kan ikke leveres før jul.
Forventes på lager: 12-03-2004
Covers the developments and areas of research in the methodological and instrumental aspects of x-ray spectrometry. This title includes the advanced and high-tech aspects of the chemical analysis techniques based on x-rays. It introduces various types of X-ray optics and X-ray detectors, covering history, principles, characteristics and trends.
| Forlag | John Wiley & Sons Inc |
| Forfatter | K Tsuji |
| Type | Bog |
| Format | Hardback |
| Sprog | Engelsk |
| Udgivelsesdato | 12-03-2004 |
| Første udgivelsesår | 2004 |
| Fagredaktør | Kouichi (Osaka City University Tsuji, Jasna (Micro and Trace Analysis Center Injuk, Rene (Micro and Trace Analysis Center Van Grieken |
| Originalsprog | United States |
| Sideantal | 616 |
| Indbinding | Hardback |
| Forlag | John Wiley & Sons Inc |
| Sideoplysninger | 616 pages |
| Mål | 229 x 152 x 39 |
| ISBN-13 / EAN-13 | 9780471486404 |