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Forventes på lager: 16-10-2018
This book presents the basics and methods of nanoscale analytical techniques for tribology field. The applied methods are atom probe tomography, in situ TEM, SERS, NEXAFS, in situ XPS, nanoindentation and in situ Raman spectroscopy.
| Forlag | Springer International Publishing AG |
| Type | Bog |
| Format | Hardback |
| Sprog | Engelsk |
| Udgave | 2018 ed. |
| Udgivelsesdato | 16-10-2018 |
| Første udgivelsesår | 2018 |
| Serie | Microtechnology and MEMS |
| Illustrationer | 103 Illustrations, color; 68 Illustrations, black and white; XIV, 328 p. 171 illus., 103 illus. in color. |
| Fagredaktør | Martin Dienwiebel, Maria-Isabel De Barros Bouchet |
| Originalsprog | Switzerland |
| Sideantal | 328 |
| Indbinding | Hardback |
| Forlag | Springer International Publishing AG |
| Sideoplysninger | 328 pages, 103 Illustrations, color; 68 Illustrations, black and white; XIV, 328 p. 171 illus., 103 |
| Mål | 235 x 155 |
| ISBN-13 / EAN-13 | 9783319998961 |