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Forventes på lager: 17-07-2009
Provides a comprehensive analysis of ESD failure mechanisms over a wide range of semiconductor materials, devices, circuits and applications. Sets out methods for eliminating failure mechanisms through workable circuit solutions, including practical examples of failure defects.
| Forlag | John Wiley & Sons Inc |
| Forfatter | Steven H. (IEEE Fellow Voldman |
| Type | Bog |
| Format | Hardback |
| Sprog | Engelsk |
| Udgivelsesdato | 17-07-2009 |
| Første udgivelsesår | 2009 |
| Originalsprog | United States |
| Sideantal | 408 |
| Indbinding | Hardback |
| Forlag | John Wiley & Sons Inc |
| Sideoplysninger | 408 pages |
| Mål | 176 x 253 x 29 |
| ISBN-13 / EAN-13 | 9780470511374 |