Steven H. (IEEE Fellow Voldman Forfatter

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  PRIS

  1.309,- kr

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  ESD: Failure Mechanisms and Models (Bog, Hardback, Engelsk)

  Af: Steven H. (IEEE Fellow Voldman

  Provides a comprehensive analysis of ESD failure mechanisms over a wide range of semiconductor materials, devices, circuits and applications. Sets out methods for eliminating failure mechanisms through workable circuit solutions, including practical examples of failure defects.

  PRIS

  1.309,- kr

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• 

  PRIS

  1.069,- kr

  FRAGTFRI LEVERING

  Levering: Skaffevare (forvent 14 - 30 hverdage)

  Bemærk: Kan ikke leveres før jul.

  ESD Testing: From Components to Systems (Bog, Hardback, Engelsk)

  Af: Steven H. (IEEE Fellow Voldman

  Presenting information on electrostatic discharge (ESD) and the characterization of semiconductor devices, this book examines ESD physical models and discusses the... Læs mere

  PRIS

  1.069,- kr

  FRAGTFRI LEVERING

  Levering: Skaffevare (forvent 14 - 30 hverdage)

  Læg i kurv