Cher Ming Tan Forfatter

• 

  PRIS

  483,- kr

  FRAGT FRA 35,-

  Levering: Skaffevare (forvent 14 - 30 hverdage)

  Electromigration Modeling at Circuit Layout Level (Bog, Paperback / softback, Engelsk)

  Af: Cher Ming Tan

  Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels.

  PRIS

  483,- kr

  FRAGT FRA 35,-

  Levering: Skaffevare (forvent 14 - 30 hverdage)

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• 

  PRIS

  1.423,- kr

  FRAGTFRI LEVERING

  Levering: Skaffevare (forvent 14 - 30 hverdage)

  Graphene and VLSI Interconnects (Bog, Hardback, Engelsk)

  Af: Cher Ming Tan

  This book is a compilation of comprehensive studies done on the properties of graphene and its synthesis methods suitable for VLSI interconnects’ applications.

  PRIS

  1.423,- kr

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  Levering: Skaffevare (forvent 14 - 30 hverdage)

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• 

  PRIS

  966,- kr

  FRAGT FRA 35,-

  Levering: Skaffevare (forvent 14 - 30 hverdage)

  Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections (Bog, Hardback, Engelsk)

  Af: Cher Ming Tan

  Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application of finite element methods (FEMs) to the study of ULSI interconnect reliability.

  PRIS

  966,- kr

  FRAGT FRA 35,-

  Levering: Skaffevare (forvent 14 - 30 hverdage)

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