Nisar Ahmed Forfatter
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Nanometer Technology Designs: High-Quality Delay Tests (Bog, Hardback, Engelsk)
Supply noise (including IR-drop, ground bounce, and Ldi/dt) effects on chip performance, high test pattern volume, low fault/defect coverage, small... Læs mere
Levering: Skaffevare (forvent 14 - 30 hverdage)
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