Bemærk: Kan ikke leveres før jul.
Forventes på lager: 29-12-1998
Examines the principal failure mechanisms associated with modern integrated circuits and describes common practices used to resolve them. This book provides a framework for how to model the mechanism, test for defects, and avoid and manage damage.
| Forlag | Taylor & Francis Inc |
| Forfattere | Michael Pecht, Riko Radojcic, Gopal Rao |
| Type | Bog |
| Format | Hardback |
| Sprog | Engelsk |
| Udgivelsesdato | 29-12-1998 |
| Første udgivelsesår | 1998 |
| Originalsprog | United States |
| Sideantal | 224 |
| Indbinding | Hardback |
| Forlag | Taylor & Francis Inc |
| Sideoplysninger | 224 pages |
| Mål | 234 x 156 |
| ISBN-13 / EAN-13 | 9780849396243 |