Ion Beam Analysis: Fundamentals and Applications (Bog, Paperback / softback, Engelsk) af Michael Nastasi

Ion Beam Analysis: Fundamentals and Applications

(Bog, Paperback / softback, Engelsk)
Forfattere: Michael Nastasi, James W. Mayer, Yongqiang Wang

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Beskrivelse

This book explains the basic characteristics of ion beams as applied to the analysis of materials, as well as IBA of art/archaeological objects. It focuses on the fundamentals and applications of ion beam methods of materials characterization. It starts with coverage of the fundamentals of ion beam analysis, including kinematics, ion stopping, R

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Alle detaljer

Forlag Taylor & Francis Ltd
Forfattere Michael Nastasi, James W. Mayer, Yongqiang Wang
Type Bog
Format Paperback / softback
Sprog Engelsk
Udgivelsesdato 25-11-2019
Første udgivelsesår 2019
Originalsprog United Kingdom
Sideantal 472
Indbinding Paperback / softback
Forlag Taylor & Francis Ltd
Sideoplysninger 472 pages
Mål 155 x 233 x 32
ISBN-13 / EAN-13 9780367445843