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Forventes på lager: 18-11-2023
They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits.
| Forlag | Springer International Publishing AG |
| Forfattere | Mohsen Raji, Behnam Ghavami |
| Type | Bog |
| Format | Paperback / softback |
| Sprog | Engelsk |
| Udgave | 2023 ed. |
| Udgivelsesdato | 18-11-2023 |
| Første udgivelsesår | 2023 |
| Illustrationer | 13 Illustrations, color; 18 Illustrations, black and white |
| Originalsprog | Switzerland |
| Sideantal | 107 |
| Indbinding | Paperback / softback |
| Forlag | Springer International Publishing AG |
| Sideoplysninger | 107 pages, 13 Illustrations, color; 18 Illustrations, black and white |
| Mål | 235 x 155 |
| ISBN-13 / EAN-13 | 9783031153471 |