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Forventes på lager: 15-06-2024
It is shown that the detected domain walls appear exactly at the locations of the atomic steps, and their thickness increases in proportion to the film thickness with a proportionality coefficient of the order of one.
| Forlag | Springer Verlag, Singapore |
| Forfatter | Alexander S. Sigov |
| Type | Bog |
| Format | Paperback / softback |
| Sprog | Engelsk |
| Udgave | 2023 ed. |
| Udgivelsesdato | 15-06-2024 |
| Første udgivelsesår | 2024 |
| Serie | Springer Aerospace Technology |
| Illustrationer | 14 Illustrations, color; 64 Illustrations, black and white |
| Originalsprog | Singapore |
| Sideantal | 137 |
| Indbinding | Paperback / softback |
| Forlag | Springer Verlag, Singapore |
| Sideoplysninger | 137 pages, 14 Illustrations, color; 64 Illustrations, black and white |
| Mål | 235 x 155 |
| ISBN-13 / EAN-13 | 9789811962486 |